Near field microscopies cover a whole of techniques making it possible to visualize the surface of materials at a nanometric scale. These microscopies gather: - Scanning Tunneling Microscopy (STM) - Atomic Force Microscopy (AFM) - Magnetic Force Microscopy (MFM) All these techniques have in common the positioning nanometric of a tip on top of the sample whose position is controlled according to the selected signal (current, force).