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Reflectivity curve simulations and fitting

The first simulation program allows you to calculate reflectivity of arbitrary magnetic multilayers systems. It also allows to fit various parameters of your system. This program is only available for the Win95/NT/2000/XP platforms.

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* Download the latest version New Release V1.7 (26 January11)

SimulReflec_install_V175.exe (version 1.75, Windows 2000/XP platforms only) (HTML Help files are included)
Source Files :
SimulReflec_V17_D6src (including DLLs)
Additional source files for some of the units :
Common_D6src

* NEW in version 1.74:
Imporved Profile plotting.

Important note : before starting the program, make sure that your decimal separator is set to dot “.” (instead of comma “,”)

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* Manuals : 

HTML manual : SimulReflecHelp

HTML manual of the PARSER : ParserFunctions

Download the manual : SimulReflec_Manual (Word2000 file)

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Previous versions

Unzip the file in a temporary folder and start 'setup.exe'.
WARNING : do not use this version if the Delphi RAD tool is installed on your computer (the setup overrides some of the Delphi settings)
Use instead this version (which contains the sources for Delphi 4):
SimulReflecV111_DelphiSrc.zip

Download : SimulReflec V10.zip (version 1.0, Windows 95/NT4 platforms only)
Download :
SimulReflec V11.zip (version 1.1, Windows 95/NT4 platforms only)
Download :
SimulReflec V111.zip (version 1.11, Windows 95/NT4 platforms only)
Download :
SimulReflec V12.zip (version 1.2, Windows 95/98/NT4 platforms only)

NEW INSTALLATION PROCEDURE FOR V1.3 : simply execute the file ; the program is then ready to use
Download :
SimulReflec_install_V130.exe (version 1.30, Windows 95/98/NT4/2000 platforms only)
Download :
SimulReflec_install_V131.exe (version 1.31, Windows 95/98/NT4/2000 platforms only)
Download :
SimulReflec_install_V132.exe (version 1.32, Windows 95/98/NT4/2000 platforms only)

SimulReflec_V140.exe (version 1.40, Windows 95/98/NT4/2000 platforms only) (HTML Help files are included)
Source Files :
Simulreflec_V14b10_D6src.exe (except DLLs)
SimulReflec_V141.exe (version 1.41, Windows 95/98/NT4/2000 platforms only) (HTML Help files are included)
Source Files :
Simulreflec_V14b12_D6src.zip (including DLLs)
SimulReflec_install_V142.exe (version 1.43, Windows 95/98/NT4/2000 platforms only) (HTML Help files are included)
SimulReflec_install_V148p2.exe (version 1.48, Windows 95/98/NT4/2000/XP platforms only) (HTML Help files are included)

* NEW in version 1.1: Implementation of diffuse scans (without spin-flip)
Easier manipulation of the system description (INSERT, COPY, PASTE, DELETE)
More flexible way of saving the fitting files (but keeps the compatibility with version 1.0) (the changes are transparent to the user)
Possibility to easily compare two sets of curves (see [STORE] button)
Important corrections fot the fitting procedure of x-ray data
KNOWN BUG : when loading a fit file you have to do it twice (this bug is under correction) 
NEW in version 1.11:
File management is much improved + the previous session files are automatically loaded
Generation of profiles has been upgraded + their use during the fits
Goody : audio messages

* NEW in version 1.2:
The resolution is now taken into account as dQz. It is now also possible to work with (Qz, R) data files
This allows the processing of
Time of Flight measurements
This version is also
much faster (up to a factor 5!)
Minor bugs corrections (the normalisation can now be properly fitted)
But the "High Field" option does not work any more (please use version V1.11)

* NEW in version 1.30:
Support for Windows 2000
Vast changes in the internal structure of the program
However some older features have not been reactivated yet.
NEW in version 1.31:
The calculation and fitting of multilayers is again available (including thickness functions and roughness functions)
The stability plots are again activated
NEW in version 1.32:
Numerous small fixes.

* NEW in version 1.40: deprecated : contains a bug which prevents fitting
NEW INTERFACE following the “SpectraProcessor” interface. Many new possibilities are now available.
All the things that should work are actually working and some calculations make sense again.
The resolution processing has been upgraded to be much, much faster. Time of Flight is available.
All the functionnalities of versions 1.1 and 1.2 have been recovered + lots of additionnal possibilities.
New polarised surface diffraction module (using a DWBA approximation).
However, this version has been tested only for a few months and bugs may appear.
The “profiles” module is still weak and should be used with most care.
The user should refer to SpectraProcessor for the new functionalities.
Version 1.3 is deprecated and should not be used any more (many calculation bugs were present).
NEW in version 1.41: deprecated : contains a bug which prevents fitting polarised neutron data (?!)
NEW in version 1.42:
Corrects a serious bug which prevented fitting some parameters! (i.e. the 1.41 patch was not working properly)
It is now possible to fit polarised data with spin-flip.
Minor improvements in the interface.
The surface diffraction module has been much improved
NEW in version 1.43:
Possibility to fit using correlated parameters.
The use of “Profiles” has been vastly improved.
It is now possible to fit data using the superposition of 2 types of domains (that is supposing non homogeneous films). Example : 2 types of magnetic domains orientations within a magnetic thin film.
NEW in version 1.44:
Improvement of the SLD profiles plotting.
Correction of bugs related to the Time Of Flight option.
Corrections of tiny ergonomy bugs (but which had no incidence on the program performances and accuracy).
Improved help system.
NEW in version 1.45:
New interface for the access to the database of neutron and x-rays SLD (see Main window menu).
Minor user interface improvements.
NEW in version 1.46:
Possibility to fit incomplete data sets (e.g. when dataPoints are negative after background corrections or when the full set UP-DO-SF is not available over the full Qz range)
NEW in version 1.47:
Correction of “minor” bugs. Improved stability.
NEW in version 1.48:
Reactivation of the option “with spin-flip high field”.
Large improvement in fitting speed for the “with spin flip” option (x5)
Patch 1 : corrects a memory leak which occurred with the option “with SF high field”
Patch 2 : the absorption is taken into account in the option “with SF high field”
NEW in version 1.49:
Possibility to perform fits on multiple data sets.
At the moment, the limitation is that the different data sets must have been measured in the same experimental conditions (angular and wavelength resolutions)
It is especially suited for data measured in a varying external parameter (such as the magnetic field or the temperature for example)

* NEW in version 1.5:
This version works well (and fast) under WinXP.
The file I/O has been much improved.
Excel does not need to be installed anymore.
* NEW in version 1.51:
Includes the possibility to fit on the spin asymmetry, the “cos PHI” and “sin² PHI” variables.
Patch 1 : le passage RX – neutrons dans une même session ne pose plus de problème
* NEW in version 1.52:
Improved support calculation for the phases, the amplitudes and transmissions.
Patch 1 : corrects a small error message which appeared when inserting a new line in the model

* NEW in version 1.61:
New 2D graph window
Wave-packet reflectivity simulations
Some improvements in the SLD profiles plotting (works for ML now)

* NEW in version 1.70:
Fitting using genetic algorithm (differential evolution)
* NEW in version 1.71:
The fit file can now save SDMS parameters (for off-specular scattering)
* NEW in version 1.72:
Transparent import of EROS .00 files
Correction of small bugs
* NEW in version 1.73:
Internal code rewriting.
Improved handling of profiles.
Plot of Zeeman effects in ToF.

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A second simulation program is available. It is intended to be multi-platform by using Mathematica scripts.

Download the notebook : reflecMCA.zip
(Mathematica notebook, portable on any platform, IF Mathematica is available on your system of course !)

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LABORATOIRE LEON BRILLOUIN (CEA/CNRS) mise à jour : 23/03/2002

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