Polarised Reflectometer for the Investigation of Surface Magnetism.
This spectrometer is especially adapted to the study of magnetic thin films and multilayers to determine their in-plane internal magnetic structure. It is possible to measure the reflectivity of the system for all spin states. The typical reflectivity range is of 105 to 106 for a 1cm²; sample and a typical reflectivity curves takes 12 hours for a full analysis scan.
Detailed description of the reflectometer PRISM
01 69 08 61 21 / 01 69 08 65 16
Fax: 01 69 08 82 61
BRILLOUIN (CEA/CNRS) mise à jour :